Hitachi Oxford SRP-4 Surface Cu Probe

Surface Cu Srp-4 Probe Measured by the principle of microresistance, the SRP probe has four probes, the two probes on the outside are a constant current source, and the two probes on the inside are a voltmeter. When measuring, four probes must simultaneously contact the copper surface to form a loop. According to the formula R=U/I, the resistance R can be obtained, and then the copper thickness can be calculated according to R=p×L/S. It can be seen that the copper thickness at this time has a great relationship with the size of the cross-sectional area.

Hitachi Srp-4 Probe parameter:

Chemical cooper：10 μin – 500 μin (0.25 μm – 12.7 μm)

electroplating cooper：0.1 mil – 6 mil (2.5 μm – 152 μm)

lind with range：8 mil – 250 mil (203 μm – 6350 μm)

accuracy：±1% (±0.1 μm) according to standard plate

Accuracy

chemical cooper：standard deviation 0.2 %；

electroplating cooper：standard deviation 0.5 %

resolution：0.01 mils ≥ 1 mil, 0.001 mils <1 mil,

0.1 μm ≥ 10 μm, 0.01 μm < 10 μm, 0.001 μm < 1 μm

SRP-4 used in the CMI563 and CMI760 is a world-leading probe developed by Oxford Instruments' Industrial Analysis unit, which uses the microresistance principle to measure surface copper foil thickness. The SRP-4 probe is rugged and at the same time the SRP-4 probe can be adapted to small test areas, making it easy to use.

Srp-4 Probe Tips is replaceable

1. If the probe tip is damaged, it can be replaced in time on site, which is simple to operate and minimizes the downtime of the equipment

2. The replaceable of tip reduces the cost of replacing the entire probe

3. One-stop service: Our comprehensive product range provides a complete solution for your PCB/PWB and surface copper thickness measurement needs.