Surface Cu SRP-4 Probe for CMI563 CMI700

Surface cooper probe SRP-4 Application:

The SRP-4 probe is used on Hitachi (Oxford) instrument CMI700 and CMI563 to test the surface cooper thickness.

Surface copper (SRP-4 probe) test principle

Surface Cu Srp-4 Probe Measured by the principle of microresistance, the SRP probe has four probes, the two probes on the outside are a constant current source, and the two probes on the inside are a voltmeter. When measuring, four probes must simultaneously contact the copper surface to form a loop. According to the formula R=U/I, the resistance R can be obtained, and then the copper thickness can be calculated according to R=p×L/S. It can be seen that the copper thickness at this time has a great relationship with the size of the cross-sectional area.

Hitachi Srp-4 Probe parameter:

Chemical cooper：10 μin – 500 μin (0.25 μm – 12.7 μm)

electroplating cooper：0.1 mil – 6 mil (2.5 μm – 152 μm)

lind with range：8 mil – 250 mil (203 μm – 6350 μm)

accuracy：±1% (±0.1 μm) according to standard plate

Surface Cooper Srp-4 Probe working characteristics: 

SRP-4 Probe applies advanced micro resistance testing technology. The tethered probe consists of four probes, AB being positive and CD being negative; When measuring, the current will have a small resistance from the positive electrode to the negative electrode, and the surface copper thickness is accurately and reliably obtained through the functional relationship between the resistance value and the thickness value, which is not affected by the insulation board layer and the copper layer on the back of the circuit board. The worn Srp-4 Probe Tips is replaceable and is a patented product of Oxford Instruments. The probe's lighting function and protective cover facilitate accurate positioning during measurement.