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Home> Products> Instrument and Spare parts> Cu Thickness Tester> Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge
Hitachi Oxford CMI165 Cu Thickness Gauge

Hitachi Oxford CMI165 Cu Thickness Gauge

$4000≥1Set/Sets

Payment Type:Paypal,T/T
Incoterm:EXW
Min. Order:1 Set/Sets
Transportation:Air,Express
Port:Shenzhen
Product Attributes

Model No.CMI165

BrandHitachi

Place Of OriginJapan

PowerElectronic

ModelCMI165

BrandHitachi(Original Oxford)

Packing1 set/carton

Packaging & Delivery
Selling Units : Set/Sets
Product Description

Usage of CMI165

It's used to inspect the incoming cooper foil before PCB drilling, cutting, plating and other processes.
The Oxford Instrument CMI165 is a user-friendly, rugged, hand-held copper foil thickness gauge with temperature compensation. This versatile handheld measuring instrument is equipped with a protective cover for easy portability, durability and reliability design for use in harsh environments. Automatic temperature compensation allows on-line detection and provides the measurement of the temperature while plating copper.

CMI 165 cooper thickness tester feature:

1. The line width after etching can be measured, and the test range is finer (the line width range can be measured 0.2mm (8mils));
2, Equipped with SRP-T1 Probe Tips, with temperature compensation function, can test the thickness of high/low temperature copper foil, and this probe has lighting function, help the accurate positioning of linear copper foil detection;
3, Battery powered, handheld, easy to measure on site;
4, Non-destructive testing;
5, Achieve high precision measurement, up to 5%;
6, long idle (1 minute) automatic shutdown;
7, display unit can be mils, um or oz and English interface conversion;
8, SRP-T1 probe can be replaced by the customer, after replacement and calibration can be used;
9, the data statistics function, including data record, average value, standard deviation and upper and lower limit reminder function


Technical data for CMI165

Thickness range of chemical Cu:

0.25-12.7)um,(0.01-0.5)mils

Thickness range of electroplating Cu

2.0-254)um,(0.1-10)mils

About store
The instrument can store 9690 test results (test date and time can be set by oneself)
Testing accuracy     ±5%
Brand Hitachi(Original Oxford)
Configuration CMI165 tester+SRP-T1 probe tip+1/2 oz surface Cu Calibration Standard



***Copper thickness is measured by a four-pin probe using the principle of microresistance, in accordance with the EN14571 test standard


CMI165

CMI95M   

CMI165

CMI511(CMI500)

CMI563

CMI760(CMI700)

Technique

Microresistance 

microresistance

Eddy curreny

microresistance

microresistance

Cooper Foil

×

Cooper Clad Laminate(CCL)

×

Cooper-Surface

×

×

Cooper-Fineline

×

×

Cooper Thru-hole

×

×

×

optional

Temperature Compensation

×

×

√ (ETP probe)

Replacement Probe Tip

×

×

√ (SRP-4 probe)

Unit Selection

oz or um

mil or um

mil or um

mil or um

mil or um

 

 

 

 

 

 

Thickness Range

8 indicator lights

1/8-4 oz

5-140 um

Electroless Cu

0.01-0.5 mil

0.25-12.7 um

Electroplated Cu

0.1-10 mil

2-254 um

0.08-4.0 mil

2-102 um

Electroless Cu

0.01-0.5 mil

0.25-12.7 um

Electroplated Cu

0.1-6 mil

3-152 um

Surface Cu

0.01-10 mil

0.25-254 um

Thru-hole Cu

0.05-4 mil

1-102um

Oxford Cmi165Cmi165 1

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