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Home > Products > Instrument and Spare parts > SRP-4 Tips > SRP-4 Probe replacement tips
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SRP-4 Probe replacement tips

SRP-4 Probe replacement tips
SRP-4 Probe replacement tips
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Product Description

SRP-4 Tips is a parts of SRP-4 probe, it's replaceable and low cost compared to the entire probe

Srp-4 Probe Tips is replaceable

1. If the probe tip is damaged, it can be replaced in time on site, which is simple to operate and minimizes the downtime of the equipment

2. The replaceable of tip reduces the cost of replacing the entire probe

3. One-stop service: Our comprehensive product range provides a complete solution for your PCB/PWB and surface copper thickness measurement needs.


Srp-4 Crystal Tips descripation:

SRP-4 Probe The tethered SRP-4 probe features a rugged, reliable cable for field applications. Additionally, the SRP-4’s small footprint is convenient and user-friendly.

Specifications:Accuracy: ±1% (±0.1 μm) with reference to standards 

Precision: Electroless Copper: 0.2 % standard deviation typical Electrodeposited Copper: 0.5% standard deviation typical 

Resolution: 0.01 mils > 1 mil, 0.001 mils < 1 mil, 0.1μm > 10 μm, 0.01 μm < 10 μm, 0.001 μm < 1 μm 

Thickness Range: Electroless Copper: 10 μin–500 μin (0.25 μm–12.7 μm), Electrodeposited Copper: 0.1mil to 6 mil (152 um), 

Fine Line Measure: trace width 8 mil to 250 mil (203 um–6350 um) 

Memory Capacity: 13,500 readings 

Dimensions: 5 7/8” (L) x 3 1/8” (W) x 1 3/16” (D) (14.9 x 7.94 x 3.02 cm) 

Weight: 9 oz (0.26 kg) including battery Units: Automatic conversion between imperial and metric with a keystroke 

Battery: 9V Alkaline 

Battery Life: 65 continuous hours 

Interface: RS-232 serial port output with adjustable baud rate, for a printer or PC download 

Display: Four-digit LCD display, two-digit memory location, 1/2” (1.27cm) character height 

Statistical Display: Number of readings, standard deviation, mean, high, low 

 Statistical Report (when interfaced with a serial printer or PC download): Memory location, number of readings, copper type, fine line trace width, date/time, mean, standard deviation, percent deviation, accuracy, high, low, range, cpk, individual readings, time-stamp, histogram 


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